The Operation and Calibration of the Electron Microscope by J.W. Edington

By J.W. Edington

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After drying an "'100 A thick carbon film is evaporated onto the film in vacuo. The Formvar is dissolved away in chloroform and the support grids then contain a holey carbon film suitable for observation in the microscope. , and Adachi, K. (1965). J. Electron Microscopy, 14, 112. Harris, W. J. (1962). Nature, 196,499. Johnston, H. , and Reid, 0. (1971). J. Microscopy, 94,283.

581. Murray, R. , and Ferrier, R. P. (1968). J. Ultrastruct. , 24, 325. Oster, C. , and Skillman, D. C. (1962). 5th Intern. Congr. for Electron Microscopy, vol. 1, Academic Press, New York, p. EE-3. Phillips, R. (1960). Brit. J. Appl. , 11, 504. Phillips, V. A. (1973). , 21, 219. Pooley, D. (1966). Proc. Phys. , 89, 723. Raimes, S. (1961). The Wave Mechanics ofElectrons in Metals, North-Holland, Amsterdam, p. 289. , and Schwaighofer, B. (1970). Tschermaks Mineral. Petrog. , 14, 45. Scherzer, 0.

APPENDIX 12. PREPARATION OF HIGHRESOLUTION TEST SPECIMENS Conventionally, three types of specimen are used as high-resolution test specimens. (1) Single-crystal gold films with (001) foil plane. (2) Partially graphitised carbon black. (3) Shadowed replicas for point-to-point resolution. The preparation techniques are described below. 21a. In general these test specimens must be very thin 30-40 A with a low defect density. To achieve such a thin film it is essential to vacuum evaporate the material.

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