By Saul Wischnitzer
Publication via Wischnitzer, Saul
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A) source—for the emission of radiation which is used to form an image. (b) condenser lens—regulates the convergence (and thus the intensity) of the illuminating beam on the specimen. ) II. IMAGING SYSTEM—the lenses which together produce the final magnified image of the specimen. (c) objective lens—focuses the beam which has passed through the specimen so as to form a magnified intermediate image. (d) projection lens (or ocular)—magnifies a portion of the intermediate image to form the final image.
Spherical aberration. (A) For a glass lens. (B) For an electron lens. 53 INTRODUCTION TO ELECTRON MICROSCOPY Similarly, in the objective lens of the electron microscope, spherical aberration is also present because the zones of the lens farther from the axis have a different refractive power than those around the axial region. Electron lenses, like biconvex optical lenses, are always characterized by "positive" spherical aberration* in that their rays which pass through the marginal zones are focused nearer to the lens than paraxial rays (Fig.
On the other hand, when the electron follows the course of V1U parallel to the field, it is not deviated and continues along a straight line. The path that such an electron will take when it has both velocities simultaneously is, therefore, a helix; that is, a circle drawn out by movement along an axis parallel to its plane (Fig. 28A). 26 BASIC THEORY OF ELECTRON MICROSCOPY ® N FIG. 28. Focusing action of a uniform magnetic field. (A) An electron ε enters the uniform portion of the magnetic field of a long solenoid (the lens) at an oblique angle.