Atomic Force Microscopy: Understanding Basic Modes and by Greg Haugstad

By Greg Haugstad

This book enlightens readers on the easy floor houses and distance-dependent intersurface forces one needs to comprehend to acquire even uncomplicated information from an atomic strength microscope (AFM). the fabric turns into an increasing number of complicated through the e-book, explaining info of calibration, actual beginning of artifacts, and signal/noise boundaries. insurance spans imaging, fabrics estate characterization, in-liquid interfacial research, tribology, and electromagnetic interactions.

“Supplementary fabric for this ebook are available through coming into ISBN 9780470638828 on”

Chapter 1 assessment of AFM (pages 1–32):
Chapter 2 Distance?Dependent Interactions (pages 33–90):
Chapter three Z?Dependent strength Measurements with AFM (pages 91–136):
Chapter four Topographic Imaging (pages 137–186):
Chapter five Probing fabric houses I: part Imaging (pages 187–257):
Chapter 6 Probing fabric houses II: Adhesive Nanomechanics and Mapping Distance?Dependent Interactions (pages 258–329):
Chapter 7 Probing fabric houses III: Lateral strength tools (pages 330–378):
Chapter eight info Post?Processing and Statistical research (pages 379–399):
Chapter nine complex Dynamic strength tools (pages 400–436):

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Additional info for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Example text

G. Haugstad, and W. Gladfelter, Scan-induced patterning in glassy polymer films: Using scanning force microscopy to study plastic deformation at the nanometer length scale. Langmuir, 2003, 19: 898–909. , G. L. Gladfelter, Scan-induced patterning and the glass transition in polymer films: Temperature and rate dependence of plastic deformation at the nanometer scale. Langmuir, 2003, 19: 10390. , G. L. Gladfelter, Correlation of nanowear patterns to viscoelastic response in a thin polystyrene melt.

An exponential relationship between air pressure P and elevation Z PðZÞ ¼ P0 expðÀmgZ=RTÞ ð2:1Þ (with m ¼ average molecular mass, T ¼ average temperature at sea level, and R ¼ gas law constant) can be plotted as linear on a semilog scale, giving utility over a wide range of distances provided reasonable signal/noise in the measurements at large distance. There are caveats related to the calibration of such an altimeter, for example, related to geographic differences in the relationship between pressure and altitude.

Moreover, this scale has been calibrated to account for both the controlled distance displacement of the Z scanner and the uncontrolled vertical bending of the cantilever (Chapter 3). An important parameter in the theoretical expression describing the attraction between tip and sample beyond contact is the Hamaker constant, which relates to the mutual polarizability of pairs of interacting atoms. The dipole–dipole nature of forces responsible for this behavior on uncharged surfaces ensures a very shortrange force compared to the electrostatic force between charged surfaces, or for that matter between a charged and uncharged surface.

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